Kirkuk Journal of Science

Kirkuk Journal of Science

Effect of SiO2 Mixing on Structural Properties of ZnO Thin Films Prepared by Pulsed Laser Deposition (PLD) Technique

Document Type : Research Paper

Authors
Zuheer N. Majeed 1
Abdul-Majeed E. Al-Samarai 1
Ghuson H. Mohammed 2
1 Physics Department, College of education for pure sciences, University of Tikrit,Salah Alddin, Iraq.
2 Physics Department, College of sciences, University of Baghdad, Baghdad, Iraq.
10.32894/kujss.2018.13.4.10
Abstract
In this paper ,ZnO was mixed by various concentrations (5,10,15,20,25) w% SiO2.The mixture was deposited on glass substrate by laser pulse deposition at room temperature. X-ray results showed that there was a decrease in the peaks of zinc oxide with gradual peaks of the zinc silicate compound at angles 2Ө (25̊,38̊,48̊,66̊) due to the increase in silicon oxide concentrations rates. The infrared spectrometer Fourier transform was used to study all prepared films and gave good results about the chemical bonds of the composite and their locations and correspond to the standard results of the zinc silicate compound . The results of the Atomic Force Microscope showed that all of prepared films were having Nano scale size and there was an increase in square root roughness index.
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Keywords
Pulsed laser deposition
structural properties
concentrations
chemical bonds
Nano scale
ZnO
SiO
Kirkuk Journal of Science
Volume 13, Issue 4
Autumn 2018
Page 127-136

  • Receive Date 01 December 2018
  • Revise Date 20 December 2018
  • Accept Date 25 December 2018