Document Type : Research Paper
Solid-state nuclear track detectors such as CR-39 are used in the detection of charged particles and heavy ions. In this paper, the effect of two types of chemical etching solutions on the etching properties of the detector CR-39 of 400 µm thickness was studied. The etching properties involved the calculation of the etching parameters which are the bulk and track etch rates () respectively as well as the etch rate ratio (V), and then comparing them for the two types of etching solution. We used two sets of detectors each piece of dimensions . The detectors were irradiated with alpha particles of energy (2, 3, 4, 5) MeV using a 241Am source to obtain tracks of alpha particles in the detector. To reveal the latent tracks, the irradiated detectors were treated with aqueous KOH and NaOH solutions. Both groups of irradiated detectors were etched under the same conditions of different molarities ranged from (3-11) N at temperature (70±1) °C for both solutions for time periods ranging from (3) h. The VB was measured by the method of removal thickness difference from the detector surface by etching for the specified periods. By measuring the diameters of the tracks and the diameter growth rates (VD) for the specified intervals, the VT and VB were measured in correlation with the VB for the both types of the solution used. By comparing the results, it was appeared that the etching rates with NaOH solution is greater than that etched with KOH for VB and VT.